◆Dark-field scattering spectrum and imaging (standard function): Dark-field scattering spectrum and imaging characteristics of a single nanostructure (≥ 100nm). ◆Dark-field scattering spectrum and imaging under specific angle of incidence (optional function): Dark-field scattering spectrum and imaging characteristics under large angle oblique incidence of white light.
the scattering spectral properties of single nanoparticles, polymers and hybrid structures, such as nanospheres, nanorods, nanodisks, Au nanospheres self-assembled polymers, Au@SiO2 core-shell, Au nanorods\dye molecules, etc. The nanoparticles and biomolecules in cells, and the dynamic processes and interactions in cells. The wafer surface defects and scratches, and the defects of nanoscale structures on patterned wafers.
| Instrument | Parameters |
|---|---|
| Excitation light source | The transmission/reflection/scattering angle-resolution mode is equipped with 100W halogen lamp white-light source. |
| Optical fiber spectrometer | slit 100 um, pixel 1 × 2048, dynamic range 3000:1, integration time 1ms~60s, wavelength range 300~1000nm (some parameters can be customized). |
| 2D motorized translation stages | minimum step size 0.05um, unidirectional repetition accuracy < 1um, travel 80mm*60mm. |
| Microscopic imaging module | Imaging spatial resolution ≤ 1um; CMOS parameters: 1 inch, 2.4um pixels, resolution 15fps@5440 *3648; Half compound achromatic bright-field objective group: 5X-100X, 0.15-0.9NA; White-light Kohler illumination mode. |
| Fixed angle oblique incidence module | Angle-resolution of large angle oblique mode is ≤ 0.5 °, and the angle range of large angle oblique mode is 45 °~90 °. |
| Dark-field scattering collection module | Spatial resolution ≤ 100 nm, imaging magnification ≥ 200 times. |